Combined interface plasmon polariton and x-ray reflectivity determination of the dielectric tensor in ultrathin liquid crystal films
Pogreb, R., Cohen, G., Tarabia, M., Davidov, D., Levine, M., Sandomirsky, V.Volume:
78
Year:
1995
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.360025
File:
PDF, 1.10 MB
english, 1995