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[IEEE Frequency Control Symposium - New Orleans, LA, USA (29-31 May 2002)] Proceedings of the 2002 IEEE International Frequency Control Symposium and PDA Exhibition (Cat. No.02CH37234) - Sensitive and direct detection using rupture event scanning (REVS/spl trade/)
Kelling, S., Cooper, M.A., Stirrups, K., Karamanska, R., Ostanin, V.P., Klenerman, D., Slepstov, A., Rehak, M., Dultsev, F.N., Minson, T., Abell, C.Year:
2002
Language:
english
DOI:
10.1109/freq.2002.1075982
File:
PDF, 381 KB
english, 2002