[IEEE 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011 - Baltimore, MD, USA (2011.06.5-2011.06.10)] 2011 IEEE MTT-S International Microwave Symposium - Systematic estimation of memory effects parameters in power amplifiers' behavioral models
Fehri, Bilel, Boumaiza, SlimYear:
2011
Language:
english
DOI:
10.1109/mwsym.2011.5972927
File:
PDF, 742 KB
english, 2011