InGaN multiquantum well structure with a reduced internal electric field and carrier decay process by tunneling
Park, Y. M., Son, J. K., Chung, H. J., Sone, C., Park, Y.Volume:
95
Year:
2009
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.3274137
File:
PDF, 545 KB
english, 2009