![](/img/cover-not-exists.png)
[IEEE 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2010.11.7-2010.11.11)] 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Design dependent process monitoring for back-end manufacturing cost reduction
Chan, Tuck-Boon, Pant, Aashish, Cheng, Lerong, Gupta, PuneetYear:
2010
Language:
english
DOI:
10.1109/iccad.2010.5654280
File:
PDF, 5.78 MB
english, 2010