[IEEE 2010 Conference on Precision Electromagnetic Measurements (CPEM 2010) - Daejeon, Korea (South) (2010.06.13-2010.06.18)] CPEM 2010 - Behavior of έ(ω) and tan δ for a class of low-loss materials
Baker-Jarvis, James, Janezic, Michael D., Riddle, Bill, Kim, SungYear:
2010
Language:
english
DOI:
10.1109/cpem.2010.5544743
File:
PDF, 158 KB
english, 2010