[IEEE 2014 IEEE Custom Integrated Circuits Conference - CICC 2014 - San Jose, CA, USA (2014.9.15-2014.9.17)] Proceedings of the IEEE 2014 Custom Integrated Circuits Conference - Impact of random telegraph noise on CMOS logic circuit reliability
Matsumoto, Takashi, Kobayashi, Kazutoshi, Onodera, HidetoshiYear:
2014
Language:
english
DOI:
10.1109/cicc.2014.6945997
File:
PDF, 3.57 MB
english, 2014