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[IEEE 1996 Annual Reliability and Maintainability Symposium - Las Vegas, NV, USA (22-25 Jan. 1996)] Proceedings of 1996 Annual Reliability and Maintainability Symposium - Accelerated life testing for products without sequence effect
Bluvband, Z., Peshes, L.Year:
1996
Language:
english
DOI:
10.1109/rams.1996.500684
File:
PDF, 762 KB
english, 1996