![](/img/cover-not-exists.png)
Electron beam induced current investigations of Pt/SrTiO[sub 3−x] interface exposed to chemical and electrical stresses
Jiang, W., Evans, D., Bain, J. A., Skowronski, M., Salvador, P. A.Volume:
96
Year:
2010
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.3339303
File:
PDF, 478 KB
english, 2010