Effect of mechanical strain on 1/f noise in metal-oxide semiconductor field-effect transistors
Lim, Ji-Song, Acosta, Antonio, Thompson, Scott E., Bosman, Gijs, Simoen, Eddy, Nishida, ToshikazuVolume:
105
Year:
2009
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3080127
File:
PDF, 1.10 MB
english, 2009