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Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe
Takeuchi, Osamu, Miyakoshi, Takaaki, Taninaka, Atsushi, Tanaka, Katsunori, Cho, Daichi, Fujita, Machiko, Yasuda, Satoshi, Jarvis, Suzanne P., Shigekawa, HidemiVolume:
100
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2355432
File:
PDF, 597 KB
english, 2006