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Oxygen nonstoichiometry and dielectric evolution of BaTiO[sub 3]. Part II—insulation resistance degradation under applied dc bias
Yang, G. Y., Lian, G. D., Dickey, E. C., Randall, C. A., Barber, D. E., Pinceloup, P., Henderson, M. A., Hill, R. A., Beeson, J. J., Skamser, D. J.Volume:
96
Year:
2004
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1809268
File:
PDF, 1.05 MB
english, 2004