[IEEE IEEE Computer Society Annual Symposium on VLSI (ISVLSI '07) - Porto Alegre, Brazil (2007.03.9-2007.03.11)] IEEE Computer Society Annual Symposium on VLSI (ISVLSI '07) - Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis
Dubey, Prashant, Garg, Akhil, Bhaskarani, Sravan KumarYear:
2007
Language:
english
DOI:
10.1109/isvlsi.2007.63
File:
PDF, 220 KB
english, 2007