[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Pulsing electrical over-stress (EOS) testing and its failure analysis for advanced process integrated circuits
Yuan-Hung Tseng,, Chun-Liang Wang,, Yu-Chia Chang,Year:
2013
Language:
english
DOI:
10.1109/ipfa.2013.6599234
File:
PDF, 1.19 MB
english, 2013