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Fault-tolerance and thermal characteristics of quantum-dot cellular automata devices
Anduwan, G. A., Padgett, B. D., Kuntzman, M., Hendrichsen, M. K., Sturzu, I., Khatun, M., Tougaw, P. D.Volume:
107
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3428453
File:
PDF, 1.02 MB
english, 2010