Low-frequency noise in strained SiGe core-shell nanowire p-channel field effect transistors
Jang, Doyoung, Lee, Jae Woo, Tachi, Kiichi, Montes, Laurent, Ernst, Thomas, Kim, Gyu Tae, Ghibaudo, GerardVolume:
97
Year:
2010
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.3480424
File:
PDF, 612 KB
english, 2010