Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy
Chew, K., Rusli,, Yoon, S. F., Ahn, J., Zhang, Q., Ligatchev, V., Teo, E. J., Osipowicz, T., Watt, F.Volume:
91
Year:
2002
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1448888
File:
PDF, 365 KB
english, 2002