[IEEE 2010 IEEE Nanotechnology Materials and Devices Conference (NMDC) - Monterey, CA, USA (2010.10.12-2010.10.15)] 2010 IEEE Nanotechnology Materials and Devices Conference - An equivalent circuit model for high-k/metal gate stack MOS capacitor with dynamic leakage
Sohn, Chang-Woo, Jeong, Eui-Young, Sagong, Hyun Chul, Choi, Do-Young, Park, Min Sang, Kang, Chang Yong, Chung, Jinyong, Jeong, Yoon-HaYear:
2010
Language:
english
DOI:
10.1109/nmdc.2010.5651924
File:
PDF, 328 KB
english, 2010