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Computer simulation of void growth dynamics under the action of electromigration and capillary forces in narrow thin interconnects
Ogurtani, Tarik Omer, Oren, Ersin EmreVolume:
90
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1382835
File:
PDF, 535 KB
english, 2001