Characterization and modelling of carrier distribution and gate capacitance in MOS structure inversion layer
Yutao,, Liu, Litian, Yu, Zhiping, Li, ZhijianVolume:
88
Language:
english
Journal:
International Journal of Electronics
DOI:
10.1080/00207210010028313
Date:
April, 2001
File:
PDF, 419 KB
english, 2001