[IEEE 2013 6th International IEEE/EMBS Conference on Neural Engineering (NER) - San Diego, CA, USA (2013.11.6-2013.11.8)] 2013 6th International IEEE/EMBS Conference on Neural Engineering (NER) - Assessing Spike Sorting contribution to neural implant reliability
Furno, L., Rigosa, J., Panarese, A., Micera, S.Year:
2013
Language:
english
DOI:
10.1109/ner.2013.6696210
File:
PDF, 984 KB
english, 2013