Atomic resolution crystallography and XAFS

Atomic resolution crystallography and XAFS

Richard W. Strange, Mark Ellis, S.Samar Hasnain
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Volume:
249
Year:
2005
Language:
english
Pages:
12
DOI:
10.1016/j.ccr.2004.03.019
File:
PDF, 869 KB
english, 2005
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