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[IEEE 1988. Proceedings., Annual Reliability and Maintainability Symposium, - Los Angeles, CA, USA (26-28 Jan. 1988)] 1988. Proceedings., Annual Reliability and Maintainability Symposium, - Estimating integrated-circuit failure rates from field performance
Beltrano, F.S.Year:
1988
Language:
english
DOI:
10.1109/arms.1988.196470
File:
PDF, 351 KB
english, 1988