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[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Understanding Soft Defect Localization set-points for reducing cause-not-founds in integrated circuits
Ravikumar, V.K., Phoa, S.L., Narang, V., Chin, J.M.Year:
2008
Language:
english
DOI:
10.1109/ipfa.2008.4588203
File:
PDF, 247 KB
english, 2008