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Summary Abstract: Bonding at the K/Si(100)2×1 interface: A surface extended x-ray absorption fine-structure study
Kendelewicz, T.Volume:
6
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.575063
Date:
May, 1988
File:
PDF, 381 KB
english, 1988