Note: Accurate determination of thickness of multiple...

Note: Accurate determination of thickness of multiple layers of thin film deposited on a piezoelectric quartz crystal

Wajid, Abdul
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Volume:
84
Year:
2013
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4825036
File:
PDF, 340 KB
english, 2013
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