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Assessing thermal damage in silicon PN-junctions using Raman thermometry
Beechem, Thomas E., Serrano, Justin R., McDonald, Anthony, Mani, SeethambalVolume:
113
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4798382
File:
PDF, 1.89 MB
english, 2013