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[IEEE 2011 IEEE International Conference on Data Engineering (ICDE 2011) - Hannover, Germany (2011.04.11-2011.04.16)] 2011 IEEE 27th International Conference on Data Engineering - Generating test data for killing SQL mutants: A constraint-based approach
Shah, Shetal, Sudarshan, S., Kajbaje, Suhas, Patidar, Sandeep, Gupta, Bhanu Pratap, Vira, DevangYear:
2011
Language:
english
DOI:
10.1109/icde.2011.5767876
File:
PDF, 242 KB
english, 2011