[IEEE TENCON 2005 - 2005 IEEE Region 10 Conference -...

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[IEEE TENCON 2005 - 2005 IEEE Region 10 Conference - Melbourne, Australia (2005.11.21-2005.11.24)] TENCON 2005 - 2005 IEEE Region 10 Conference - The Detection of Curve-type Defects in the TFT-LCD panels with Machine Vision

Kim, Woo-seob, Chung, Yun-su, Oh, Jong-hwan, Choi, Il, Park, Kil-houm
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Year:
2005
Language:
english
DOI:
10.1109/tencon.2005.301019
File:
PDF, 284 KB
english, 2005
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