[IEEE 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (2007.02.11-2007.02.15)] 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - A Self-Calibrated On-chip Phase-Noise-Measurement Circuit with -75dBc Single-Tone Sensitivity at 100kHz Offset

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