![](/img/cover-not-exists.png)
[IEEE 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (2007.02.11-2007.02.15)] 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - A Self-Calibrated On-chip Phase-Noise-Measurement Circuit with -75dBc Single-Tone Sensitivity at 100kHz Offset
Khalil, Waleed, Bakkaloglu, Bertan, Kiaei, SayfeYear:
2007
Language:
english
DOI:
10.1109/isscc.2007.373536
File:
PDF, 2.71 MB
english, 2007