Carrier recombination near threading dislocations in GaN...

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Carrier recombination near threading dislocations in GaN epilayers by low voltage cathodoluminescence

N. Pauc, M. R. Phillips, V. Aimez, D. Drouin
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Year:
2006
Language:
english
DOI:
10.1063/1.2357881
File:
PDF, 593 KB
english, 2006
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