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Information depth and the mean escape depth in Auger electron spectroscopy and x-ray photoelectron spectroscopy
Jablonski, A., Powell, C. J.Volume:
21
Year:
2003
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.1538370
File:
PDF, 420 KB
english, 2003