[IEEE 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012) - Washington, DC, USA (2012.07.1-2012.07.6)] 2012 Conference on Precision electromagnetic Measurements - S-parameter resonance method for the calibration of standard capacitors
Ozkan, Turgay, Gulmez, Gulay, Gulmez, Yakup, Turhan, Enis, Te Neli, N. BernaYear:
2012
Language:
english
DOI:
10.1109/cpem.2012.6251118
File:
PDF, 326 KB
english, 2012