[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Improvements of NBTI reliability in SiGe p-FETs
Franco, J., Kaczer, B., Cho, M., Eneman, G., Groeseneken, G., Grasser, T.Year:
2010
Language:
english
DOI:
10.1109/irps.2010.5488668
File:
PDF, 622 KB
english, 2010