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[IEEE 1995 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - Rio de Janeiro, Brazil (24-27 July 1995)] Proceedings of 1995 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - Time domain analysis of a through hole via with time dependent skin effect model
Xiao-Ding Cai,, Costache, G.I.Volume:
2
Year:
1995
Language:
english
DOI:
10.1109/sbmomo.1995.509728
File:
PDF, 317 KB
english, 1995