Optical and structural characterization of AlInN layers for optoelectronic applications
Aschenbrenner, T., Dartsch, H., Kruse, C., Anastasescu, M., Stoica, M., Gartner, M., Pretorius, A., Rosenauer, A., Wagner, Thomas, Hommel, D.Volume:
108
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3467964
File:
PDF, 3.94 MB
english, 2010