Scanning microwave microscopy/spectroscopy on...

Scanning microwave microscopy/spectroscopy on metal-oxide-semiconductor systems

Smoliner, J., Huber, H. P., Hochleitner, M., Moertelmaier, M., Kienberger, F.
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Volume:
108
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3482065
File:
PDF, 556 KB
english, 2010
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