Atomic force microscopy for the determination of refractive index profiles of optical fibers and waveguides: A quantitative study
Huntington, S. T., Mulvaney, P., Roberts, A., Nugent, K. A., Bazylenko, M.Volume:
82
Year:
1997
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.366103
File:
PDF, 1.41 MB
english, 1997