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Atomic force microscopy for the determination of refractive...

Atomic force microscopy for the determination of refractive index profiles of optical fibers and waveguides: A quantitative study

Huntington, S. T., Mulvaney, P., Roberts, A., Nugent, K. A., Bazylenko, M.
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Volume:
82
Year:
1997
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.366103
File:
PDF, 1.41 MB
english, 1997
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