[IEEE Comput. Soc. Press 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers - Santa Clara, CA, USA (11-14 Nov. 1991)] 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers - PARIS: a parallel pattern fault simulator for synchronous sequential circuits
Gouders, N., Kaibel, R.Year:
1991
DOI:
10.1109/iccad.1991.185327
File:
PDF, 367 KB
1991