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[IEEE 2014 IEEE AUTOTEST - St. Louis, MO, USA (2014.9.15-2014.9.18)] 2014 IEEE AUTOTEST - Linearized adaptation of non-linear post conversion correction for TIADCs: A behavorial model study
Parkey, Charna R., Mikhael, Wasfy B.Year:
2014
Language:
english
DOI:
10.1109/autest.2014.6935125
File:
PDF, 844 KB
english, 2014