[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Architecting a common-source-line array for bipolar non-volatile memory devices
Bo Zhao,, Jun Yang,, Youtao Zhang,, Yiran Chen,, Hai Li,Year:
2012
Language:
english
DOI:
10.1109/date.2012.6176594
File:
PDF, 1.49 MB
english, 2012