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[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Effective Post-BIST Fault Diagnosis for Multiple Faults
Takahashi, Hiroshi, Kadoyama, Shuhei, Higami, Yoshinobu, Takamatsu, Yuzo, Yamazaki, Koji, Aikyo, Takashi, Sato, YasuoYear:
2006
Language:
english
DOI:
10.1109/dft.2006.24
File:
PDF, 159 KB
english, 2006