A test facility for 200 kA SMES/ETM conductors

IEEE Transactions on Magnetics 1991 / 3 Vol. 27; Iss. 2

A test facility for 200 kA SMES/ETM conductors

Zeigler, J., Colvin, J., Huson, R., Rocha, R., Shotzman, G., Michels, P., Peck, S.
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Volume:
27
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/20.133701
Date:
March, 1991
File:
PDF, 503 KB
english, 1991
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