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[IEEE 2013 International Conference on IC Design & Technology (ICICDT) - Pavia, Italy (2013.05.29-2013.05.31)] Proceedings of 2013 International Conference on IC Design & Technology (ICICDT) - High-speed and highly accurate evaluation of electrical characteristics in MOSFETs
Teramoto, Akinobu, Sugawa, Shigetoshi, Ohmi, TadahiroYear:
2013
Language:
english
DOI:
10.1109/icicdt.2013.6563333
File:
PDF, 603 KB
english, 2013