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[IEEE 2012 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Rome, Italy (2012.09.17-2012.09.21)] International Symposium on Electromagnetic Compatibility - EMC EUROPE - Progress towards a combined CIM/MoM approach for EMI analysis of electronic systems
Duan, Xiaomin, Vogt, Alexander, Dietrich Bruns, Heinz, Schuster, ChristianYear:
2012
Language:
english
DOI:
10.1109/emceurope.2012.6396734
File:
PDF, 2.49 MB
english, 2012