[IEEE 11th International Conference on Ion Implantation Technology - Austin, TX, USA (16-21 June 1996)] Proceedings of 11th International Conference on Ion Implantation Technology - Use of accelerator mass spectrometry for trace element detection
Zhao, Z.Y., Mehta, S., Angel, G., Datar, S.A., Renfrow, S.N., McDaniel, F.D., Anthony, J.M.Year:
1997
Language:
english
DOI:
10.1109/iit.1996.586150
File:
PDF, 358 KB
english, 1997