![](/img/cover-not-exists.png)
[IEEE 2011 IEEE International Conference on Consumer Electronics (ICCE) - Las Vegas, NV, USA (2011.01.9-2011.01.12)] 2011 IEEE International Conference on Consumer Electronics (ICCE) - User-driven optimized test case design and modeling for end-user device quality inspection
Marijan, Dusica, Zlokolica, Vladimir, Teslic, Nikola, Tekcan, Tarkan, Pekovic, VukotaYear:
2011
Language:
english
DOI:
10.1109/icce.2011.5722906
File:
PDF, 129 KB
english, 2011