Low-frequency noise overshoot in ultrathin gate oxide silicon-on-insulator metal–oxide–semiconductor field-effect transistors
Mercha, A., Simoen, E., van Meer, H., Claeys, C.Volume:
82
Year:
2003
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.1561575
File:
PDF, 248 KB
english, 2003