Characterization of the luminescence center in photo- and...

Journal of Applied Physics 1999 Vol. 86; Iss. 5

Characterization of the luminescence center in photo- and electroluminescent amorphous silicon oxynitride films

Price, K. J., McNeil, L. E., Suvkanov, A., Irene, E. A., MacFarlane, P. J., Zvanut, M. E.
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Volume:
86
Year:
1999
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.371102
File:
PDF, 366 KB
english, 1999
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