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[IEEE IEEE Autotestcon, 2005. - Orlando, Florida (Sept. 26, 2005)] IEEE Autotestcon, 2005. - Using new instrument interface standards to increase automatic test system performance
Sethunadh, R.Year:
2005
Language:
english
DOI:
10.1109/autest.2005.1609216
File:
PDF, 84 KB
english, 2005